Reliability of lead-free interconnections under consecutive thermal and mechanical loadings

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Reliability of Lead-Free Interconnections under Consecutive Thermal and Mechanical Loadings

To simulate more realistically the effects of strains and stresses on the reliability of portable electronic products, lead-free test assemblies were thermally cycled (−45°C/+125°C, 15-min. dwell time, 750 cycles) or isothermally annealed (125°C, 500 h) before the standard drop test. The average number of drops to failure increased when the thermal cycling was performed before the drop test (1,...

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Impact of printed wiring board coatings on the reliability of lead-free chip-scale package interconnections

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ژورنال

عنوان ژورنال: Journal of Electronic Materials

سال: 2006

ISSN: 0361-5235,1543-186X

DOI: 10.1007/bf02692443